|
Trade Shows and Conferences
-
Eric Bogatin, Don DeGroot, Paul G. Huray, Yuriy Shlepnev, Which one is better? Comparing Options to Describe Frequency Dependent Losses, Ballroom E, 11:05 am - 11:45 am, Wednesday, January 30, 2013. The paper is nominated for DesignCon 2013 best paper award and is available in publications section and presentation in presentations section.
-
-
DesignCon 2012, Santa Clara, CA
Y. Shlepnev, C. Nwachukwu, Practical methodology for analyzing the effect of conductor roughness on signal losses and dispersion in interconnects. 9:20 am - 10:00 am, Wednesday, February 1, Ballroom G, the paper is nominated for DesignCon 2012 best paper award and is available in publications section and presentation in presentations section.
-
-
IEEE International Symposium on Electromagnetic Compatibility (EMC2011), Long Beach, CA
Y. Shlepnev, C. Nwachukwu, Roughness characterization for interconnect analysis. - Proc. of the 2011 IEEE International Symposium on Electromagnetic Compatibility, Long Beach, CA, USA, August, 2011, p. 518-523. Paper is also available in publications section and presentation in technical presentations section.
-
IEEE International Symposium on Electromagnetic Compatibility (EMC2011), Long Beach, CA
Y. Shlepnev, S. McMorrow, Nickel characterization for interconnect analysis. - Proc. of the 2011 IEEE International Symposium on Electromagnetic Compatibility, Long Beach, CA, USA, August, 2011, p. 524-529. Paper is also available in publications section and presentation in technical presentations section.
-
-
-
-
-
-
-
-
DesignCon2010, Santa Clara, CA
H. Barnes, Y. Shlepnev, J. Nadolny, T. Dagostino, S. McMorrow, Quality of High Frequency Measurements: Practical Examples, Theoretical Foundations, and Successful Techniques that Work Past the 40GHz Realm, tutorial TF-MP12, February 1, 2010, 9am - 12 pm , all presentations are available in the technical presentation section.
-
-
DesignCon2009, Santa Clara, CA
Y. Shlepnev, A. Neves, T. Dagostino, S. McMorrow, Measurement-Assisted Electromagnetic Extraction of Interconnect Parameters on Low-Cost FR–4 boards for 6–20 Gbps Applications, Track 12-WA1, 8:30am-9:10am, the paper won DesignCon 2009 best paper award and is available in publications section and presentation is in presentations section.
-
|